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conference paper
New Method for Temperature-Dependent Thermal Resistance and Capacitance Accurate Extraction in DMOS Transistors
2003
IEEE International Electron Devices Meeting 2003
Type
conference paper
Authors
Publication date
2003
Published in
IEEE International Electron Devices Meeting 2003
Start page
5.6.1
End page
5.6.4
Peer reviewed
NON-REVIEWED
EPFL units
Available on Infoscience
October 10, 2007
Use this identifier to reference this record