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  4. FOSS EKV 2.6 parameter extractor
 
conference paper

FOSS EKV 2.6 parameter extractor

Grabinski, Wladek
•
Tomaszewski, Daniel
•
Jazaeri, Farzan  
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2015
Parameter extractor
Mixed Design of Integrated Circuits & Systems (MIXDES), 2015 22nd International Conference

The design of advanced integrated circuits (IC) in particular for low power analog and radio-frequency (RF) application becomes more complex as the device level modeling confronting challenges in micro- and nano-meter CMOS processes. As present CMOS technologies continue geometry scaling the designers can benefit using dedicated SPICE MOSFET models and apply specific analog design methodologies. The EKV was developed especially to meet altogether the analog/RF design requirements. This paper describes a basic set of the DC parameter extraction steps for the EKV 2.6 model. The free open source software (FOSS) Profile2D tool was used to illustrate accurate EKV 2.6 DC extraction strategy.

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Type
conference paper
DOI
10.1109/MIXDES.2015.7208507
Web of Science ID

WOS:000364071600034

Author(s)
Grabinski, Wladek
Tomaszewski, Daniel
Jazaeri, Farzan  
Mangla, Anurag  
Sallese, Jean-Michel  
Chalkiadaki, Maria-Anna  
Bazigos, Antonios  
Bucher, Mathias
Date Issued

2015

Publisher

Ieee

Publisher place

New York

Published in
Parameter extractor
ISBN of the book

978-8-3635-7806-0

Total of pages

6

Start page

181

End page

186

Subjects

FOSS

•

EKV 2.6

•

Profile2D

•

DC

•

parameter extraction

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
EDLAB  
Event nameEvent placeEvent date
Mixed Design of Integrated Circuits & Systems (MIXDES), 2015 22nd International Conference

Torun

25-27 June 2015

Available on Infoscience
November 11, 2015
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/120553
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