Repository logo

Infoscience

  • English
  • French
Log In
Logo EPFL, École polytechnique fédérale de Lausanne

Infoscience

  • English
  • French
Log In
  1. Home
  2. Academic and Research Output
  3. Conferences, Workshops, Symposiums, and Seminars
  4. Conformal Mapping Based DC Current Model For Double Gate Tunnel FETs
 
Loading...
Thumbnail Image
conference paper

Conformal Mapping Based DC Current Model For Double Gate Tunnel FETs

Biswas, Arnab  
•
De Michielis, Luca  
•
Alper, Cem  
Show more
2014
Proceedings of the 15th International Conference on Ultimate Integration on Silicon (ULIS)
15th International Conference on Ultimate Integration on Silicon (ULIS)

In this work, the conformal mapping technique is applied to obtain an analytical closed form solution of the 2D Poisson’s equation for a double-gate Tunnel FET. The generated band profiles are accurate in all regions of device operation. Furthermore, the current levels are estimated by implementing the non-local band-to-band tunneling model from Synopsys Sentaurus TCAD. A good agreement with simulations for varying device parameters is demonstrated and the advantages and limitations of the new modeling approach are investigated and discussed.

  • Details
  • Metrics
Type
conference paper
DOI
10.1109/ULIS.2014.6813922
Web of Science ID

WOS:000341731300022

Author(s)
Biswas, Arnab  
•
De Michielis, Luca  
•
Alper, Cem  
•
Ionescu, Mihai Adrian  
Date Issued

2014

Publisher

IEEE

Publisher place

New York

Journal
Proceedings of the 15th International Conference on Ultimate Integration on Silicon (ULIS)
Total of pages

4

Series title/Series vol.

International Conference on Ultimate Integration on Silicon

Start page

85

End page

88

URL

URL

http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6813922&refinements%3D4280478457%26sortType%3Dasc_p_Sequence%26filter%3DAND%28p_IS_Number%3A6813885%29
Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
NANOLAB  
Event nameEvent placeEvent date
15th International Conference on Ultimate Integration on Silicon (ULIS)

Stockholm ,Sweden

April 7-9, 2014

Available on Infoscience
April 10, 2014
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/102682
Logo EPFL, École polytechnique fédérale de Lausanne
  • Contact
  • infoscience@epfl.ch

  • Follow us on Facebook
  • Follow us on Instagram
  • Follow us on LinkedIn
  • Follow us on X
  • Follow us on Youtube
AccessibilityLegal noticePrivacy policyCookie settingsEnd User AgreementGet helpFeedback

Infoscience is a service managed and provided by the Library and IT Services of EPFL. © EPFL, tous droits réservés