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  4. Timing Violation Induced Faults in Multi-Tenant FPGAs
 
conference paper

Timing Violation Induced Faults in Multi-Tenant FPGAs

Mahmoud, Dina
•
Stojilovic, Mirjana  
March 25, 2019
2019 Design, Automation & Test In Europe Conference & Exhibition (Date)
Design, Automation & Test in Europe Conference & Exhibition (DATE)

FPGAs have made their way into the cloud, allowing users to gain remote access to the state-of-the-art reconfigurable fabric and implement their custom accelerators. Since FPGAs are large enough to accommodate multiple independent designs, the multi-tenant user scenario may soon be prevalent in cloud computing environments. However, shared use of an FPGA raises security concerns. Recently discovered hardware Trojans for use in multi-tenant FPGA settings target denial-of-service attacks, power side-channel attacks, and crosstalk side-channel attacks. In this work, we present an attack method for causing timing-constraints violation in the multi-tenant FPGA setting. This type of attack is very dangerous as the consequences of timing faults are temporary errors, which are often impossible to notice. We demonstrate the attack on a set of self-timed true random number generators (STRNGs), frequently used in cryptographic applications. When the attack is launched, the STRNG outputs become biased and fail randomness tests. However, after the attack, STRNGs recover and continue generating random bits.

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Type
conference paper
DOI
10.23919/DATE.2019.8715263
Web of Science ID

WOS:000470666100321

Author(s)
Mahmoud, Dina
Stojilovic, Mirjana  
Date Issued

2019-03-25

Publisher

IEEE

Publisher place

New York

Published in
2019 Design, Automation & Test In Europe Conference & Exhibition (Date)
ISBN of the book

978-3-9819263-2-3

Series title/Series vol.

Design Automation and Test in Europe Conference and Exhibition

Start page

1745

End page

1750

Subjects

Automation & Control Systems

•

Engineering, Industrial

•

Engineering, Electrical & Electronic

•

Engineering

•

fpga

•

cloud

•

multi-tenancy

•

security

•

random number generator

•

timing fault

•

voltage drop

•

temperature

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
PARSA  
Event nameEvent placeEvent date
Design, Automation & Test in Europe Conference & Exhibition (DATE)

Florence, ITALY

Mar 25-29, 2019

Available on Infoscience
June 24, 2019
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/158423
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