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  4. Learning to Match Aerial Images with Deep Attentive Architectures
 
conference paper

Learning to Match Aerial Images with Deep Attentive Architectures

Altwaijry, Hani
•
Trulls, Eduard
•
Hays, James
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2016
Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition
Computer Vision and Pattern Recognition

Image matching is a fundamental problem in Computer Vision. In the context of feature-based matching, SIFT and its variants have long excelled in a wide array of applications. However, for ultra-wide baselines, as in the case of aerial images captured under large camera rotations, the appearance variation goes beyond the reach of SIFT and RANSAC. In this paper we propose a data-driven, deep learning-based approach that sidesteps local correspondence by framing the problem as a classification task. Furthermore, we demonstrate that local correspondences can still be useful. To do so we incorporate an attention mechanism to produce a set of probable matches, which allows us to further increase performance. We train our models on a dataset of urban aerial imagery consisting of 'same' and 'different' pairs, collected for this purpose, and characterize the problem via a human study with annotations from Amazon Mechanical Turk. We demonstrate that our models outperform the state-of-the-art on ultra-wide baseline matching, and close the gap with human performance.

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Type
conference paper
DOI
10.1109/CVPR.2016.385
Author(s)
Altwaijry, Hani
Trulls, Eduard
Hays, James
Fua, Pascal  
Belongie, Serge
Date Issued

2016

Published in
Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition
Start page

3539

End page

3547

Subjects

Deep Learning

•

Stereo

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
CVLAB  
Event nameEvent placeEvent date
Computer Vision and Pattern Recognition

Las Vegas, Nevada, USA

June 27-30, 2016

Available on Infoscience
April 11, 2016
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/125600
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