Repository logo

Infoscience

  • English
  • French
Log In
Logo EPFL, École polytechnique fédérale de Lausanne

Infoscience

  • English
  • French
Log In
  1. Home
  2. Academic and Research Output
  3. Conferences, Workshops, Symposiums, and Seminars
  4. Electrical Characterisation of High Voltage MOSFETs using MESDRIFT
 
conference paper

Electrical Characterisation of High Voltage MOSFETs using MESDRIFT

Anghel, C.
•
Hefyene, N.
•
Vermandel, M.
Show more
2003
2003 International Semiconductor Conference. CAS 2003 Proceedings
  • Details
  • Metrics
Type
conference paper
DOI
10.1109/SMICND.2003.1252430
Web of Science ID

WOS:000189468100055

Author(s)
Anghel, C.
Hefyene, N.
Vermandel, M.
Bakeroot, B.
Doutreloigne, J.
Gillon, R.
Ionescu, A. M.  
Date Issued

2003

Published in
2003 International Semiconductor Conference. CAS 2003 Proceedings
Volume

2

Start page

257

End page

260

Editorial or Peer reviewed

NON-REVIEWED

Written at

EPFL

EPFL units
NANOLAB  
Available on Infoscience
October 10, 2007
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/12778
Logo EPFL, École polytechnique fédérale de Lausanne
  • Contact
  • infoscience@epfl.ch

  • Follow us on Facebook
  • Follow us on Instagram
  • Follow us on LinkedIn
  • Follow us on X
  • Follow us on Youtube
AccessibilityLegal noticePrivacy policyCookie settingsEnd User AgreementGet helpFeedback

Infoscience is a service managed and provided by the Library and IT Services of EPFL. © EPFL, tous droits réservés