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conference paper

Light field panorama by a plenoptic camera

Xue, Zhou  
•
Baboulaz, Loïc  
•
Prandoni, Paolo  
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Bouman, Charles
•
Sauer, Ken
2013
SPIE Proceedings, Computational Imaging XII
SPIE, Electronic Imaging, 2013

Consumer-grade plenoptic camera Lytro draws a lot of interest from both academic and industrial world. However its low resolution in both spatial and angular domain prevents it from being used for fine and detailed light field acquisition. This paper proposes to use a plenoptic camera as an image scanner and perform light field stitching to increase the size of the acquired light field data. We consider a simplified plenoptic camera model comprising a pinhole camera moving behind a thin lens. Based on this model, we describe how to perform light field acquisition and stitching under two different scenarios: by camera translation or by camera translation and rotation. In both cases, we assume the camera motion to be known. In the case of camera translation, we show how the acquired light fields should be resampled to increase the spatial range and ultimately obtain a wider field of view. In the case of camera translation and rotation, the camera motion is calculated such that the light fields can be directly stitched and extended in the angular domain. Simulation results verify our approach and demonstrate the potential of the motion model for further light field applications such as registration and super-resolution.

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Type
conference paper
DOI
10.1117/12.2038254
Web of Science ID

WOS:000335494800020

Author(s)
Xue, Zhou  
Baboulaz, Loïc  
Prandoni, Paolo  
Vetterli, Martin  
Editors
Bouman, Charles
•
Sauer, Ken
Date Issued

2013

Publisher

SPIE

Published in
SPIE Proceedings, Computational Imaging XII
Volume

9020

Subjects

Plenoptic camera

•

non-classical image capture

•

light field stitching

•

light field panorama

URL

URL

http://spie.org/Publications/Proceedings/Paper/10.1117/12.2038254
Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
LCAV  
Event nameEvent placeEvent date
SPIE, Electronic Imaging, 2013

San Francisco, California, USA

February 3-7, 2013

Available on Infoscience
June 18, 2014
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/104459
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