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  4. Low-temperature time-resolved cathodoluminescence study of exciton dynamics involving basal stacking faults in a-plane GaN
 
research article

Low-temperature time-resolved cathodoluminescence study of exciton dynamics involving basal stacking faults in a-plane GaN

Corfdir, Pierre  
•
Ristic, Jelena
•
Lefebvre, Pierre
Show more
2009
Applied Physics Letters

Time-resolved cathodoluminescence at 27 K has been performed on a-plane GaN grown by epitaxial lateral overgrowth. We detail the relaxation and recombination mechanisms of excitons [free or bound to neutral donors, or bound to I1-type basal stacking faults (BSFs)] in relation to the local density in BSFs. We describe the slow exciton capture rate on isolated BSFs by a diffusion model involving donors via a hopping process. Where BSFs are organized into bundles, we relate the shorter rise time to intra-BSF localization processes and the multiexponential decay to the type-II band alignment of BSFs in wurtzite GaN.

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Type
research article
DOI
10.1063/1.3142396
Web of Science ID

WOS:000266342800015

Author(s)
Corfdir, Pierre  
Ristic, Jelena
Lefebvre, Pierre
Zhu, Tiankai
Martin, Denis  
Dussaigne, Amélie  
Ganière, Jean-Daniel  
Grandjean, Nicolas  
Deveaud-Plédran, Benoît  
Date Issued

2009

Publisher

AIP American Institute of Physics

Published in
Applied Physics Letters
Volume

94

Article Number

201115

Subjects

cathodoluminescence

•

diffusion

•

excitons

•

gallium compounds

•

III-V semiconductors

•

semiconductor epitaxial layers

•

stacking faults

•

time resolved spectra

•

wide band gap semiconductors

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
LOEQ  
LASPE  
Available on Infoscience
May 23, 2009
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/40200
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