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  4. Metamodel for Safety Risk Management of Medical Devices Based on ISO 14971
 
conference paper not in proceedings

Metamodel for Safety Risk Management of Medical Devices Based on ISO 14971

Yakymets, Nataliya  
•
Ionescu, Mihai Adrian  
•
Atienza Alonso, David  
2023
The ACM/IEEE 26th International Conference on Model-Driven Engineering Languages and Systems

The integration of information technologies into medical systems has led to an increase in digitalization, which results in enormous possibilities, but also challenges in system development. The ever-growing complexity of modern medical devices (MD) requires a system-based development, which must be supported by Model-Based Systems Engineering (MBSE) approaches. Indeed, risk management (RM) and safety analysis must begin in the early development phases to ensure MD's dependability and facilitate the regulatory process. This paper proposes a metamodel that describes the safety and RM concepts related to the medical domain. This metamodel enables safety and quality experts to analyze MD and demonstrate compliance with the recommendations of ISO 14971. We have validated the proposed metamodel using the academic example of a wearable system designed for real-time EEG-based subject monitoring.

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Type
conference paper not in proceedings
Author(s)
Yakymets, Nataliya  
Ionescu, Mihai Adrian  
Atienza Alonso, David  
Date Issued

2023

Total of pages

7

Subjects

Metamodel

•

risk management

•

medical devices

•

ISO 14971

Note

pre-print

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
ESL  
NANOLAB  
Event nameEvent placeEvent date
The ACM/IEEE 26th International Conference on Model-Driven Engineering Languages and Systems

Västerås, Sweden

October 1-6, 2023

Available on Infoscience
June 26, 2023
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/197229
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