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  4. Small slope micro/nano-electronic switches
 
conference paper

Small slope micro/nano-electronic switches

Ionescu, Adrian M.  
•
Boucart, Kathy  
•
Moselund, Kirsten E.  
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2007
Cas 2007 International Semiconductor Conference
International Semiconductor Conference

This paper discusses three categories of small slope electronic switches: the Tunnel FET the IMOS and the NEM-FET which are expected to bring added value compared to CMOS by presenting an abrupt subthreshold slope, smaller than the physical limit, 60mV/decade, of the solid-state MOS transistor at room temperature. Recent results and future promises are reported.

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Type
conference paper
DOI
10.1109/SMICND.2007.4519743
Web of Science ID

WOS:000255865200084

Author(s)
Ionescu, Adrian M.  
Boucart, Kathy  
Moselund, Kirsten E.  
Pott, Vincent  
Tsamados, Dimitrios
Date Issued

2007

Publisher

Ieee Service Center, 445 Hoes Lane, Po Box 1331, Piscataway, Nj 08855-1331 Usa

Published in
Cas 2007 International Semiconductor Conference
ISBN of the book

978-1-4244-0847-4

Start page

397

End page

402

Subjects

Field-Effect Transistor

•

Mos I-Mos

•

Tunneling Transistor

•

Silicon

•

Device

•

Circuit

Editorial or Peer reviewed

NON-REVIEWED

Written at

EPFL

EPFL units
NANOLAB  
Event nameEvent placeEvent date
International Semiconductor Conference

Sinaia, ROMANIA

Oct 15-17, 2007

Available on Infoscience
July 4, 2012
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/83476
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