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  4. Reliable and Improved Nanoscale Stencil Lithography by Membrane Stabilization, Blurring and Clogging Corrections
 
research article

Reliable and Improved Nanoscale Stencil Lithography by Membrane Stabilization, Blurring and Clogging Corrections

Vazquez-Mena, Oscar  
•
Sidler, Katrin  
•
Savu, Veronica  
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2011
IEEE Transactions on Nanotechnology

The reliable and reproducible fabrication of nanostructures by stencil lithography faces three main challenges: the stability of the thin stencil membranes with nanoapertures, the blurring of the deposited structures, and the clogging of the nanoapertures in the stencil membranes. This work reports on these three important issues and presents corresponding solutions for the patterning of nanostructures by stencil lithography. To increase the stiffness and the stability of the membranes, we have used a hexagonal array of corrugations to globally reinforce the stencil membranes. To correct the blurring, we have used a corrective etching that improves the definition of Al nanostructures. Using this corrective etching, we have fabricated poly-Si nanowires. Finally, we have used metal wet etching to remove the material accumulated on the membranes as a remedy to the clogging.

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Type
research article
DOI
10.1109/TNANO.2010.2042724
Web of Science ID

WOS:000290537500022

Author(s)
Vazquez-Mena, Oscar  
Sidler, Katrin  
Savu, Veronica  
Park, Chan Woo
Villanueva, Luis Guillermo  
Brugger, Juergen  
Date Issued

2011

Published in
IEEE Transactions on Nanotechnology
Volume

10

Issue

2

Start page

352

End page

357

Subjects

Stencil lithography

•

blurring

•

clogging

•

reinforced membranes

•

nanowires

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
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NEMS  
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/46026
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