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  4. Printing sub-micron structures using Talbot mask-aligner lithography with a 193 nm CW laser light source
 
research article

Printing sub-micron structures using Talbot mask-aligner lithography with a 193 nm CW laser light source

Vetter, Andreas
•
Kirner, Raoul
•
Opalevs, Dmitrijs
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August 20, 2018
Optics Express

A continuous improvement of resolution in mask-aligner lithography is sought after to meet the requirements of an ever decreasing minimum feature size in back-end processes. For periodic structures, utilizing the Talbot effect for lithography has emerged as a viable path. Here, by combining the Talbot effect with a continuous wave laser source emitting at 193 nm, we demonstrate successfully the fabrication of periodic arrays in silicon substrates with sub-micron feature sizes. The excellent coherence and the superior brilliance of this light source, compared to more traditional mercury lamps and excimer lasers as light source, enables the efficient beam shaping and a reduced minimum feature size at a fixed gap of 20 µm. We present a comprehensive study of proximity printing with this system, including simulations and selected experimental results of prints in up to the fourth Talbot plane. This printing technology can be used to manufacture optical metasurfaces, bio-sensor arrays, membranes, or microchannel plates.

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Type
research article
DOI
10.1364/OE.26.022218
Web of Science ID

WOS:000442136200072

Author(s)
Vetter, Andreas
Kirner, Raoul
Opalevs, Dmitrijs
Scholz, Matthias
Leisching, Patrick
Scharf, Toralf
Noell, Wilfried
Rockstuhl, Carsten
Voelkel, Reinhard
Date Issued

2018-08-20

Published in
Optics Express
Volume

26

Issue

17

Article Number

22218

Subjects

Nanophotonics

•

Plasmonics

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
NAM  
Available on Infoscience
February 4, 2019
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/154304
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