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  4. Exciton Drift in Semiconductors under Uniform Strain Gradients: Application to Bent ZnO Microwires
 
research article

Exciton Drift in Semiconductors under Uniform Strain Gradients: Application to Bent ZnO Microwires

Fu, Xuewen
•
Jacopin, Gwenole  
•
Shahmohammadi, Mehran  
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2014
Acs Nano

Optimizing the electronic structures and carrier dynamics in semiconductors at atomic scale is an essential issue for innovative device applications. Besides the traditional chemical doping and the use of homo/heterostructures, elastic strain has been proposed as a promising possibility. Here, we report on the direct observation of the dynamics of exciton transport in a ZnO microwire under pure elastic bending deformation, by using cathodoluminescence with high temporal, spatial, and energy resolutions. We demonstrate that excitons can be effectively drifted by the strain gradient in inhomogeneous strain fields. Our observations are well reproduced by a drift-diffusion model taking into account the strain gradient and allow us to deduce an exciton mobility of 1400 +/- 100 cm(2)/(eV s) in the ZnO wire. These results propose a way to tune the exciton dynamics in semiconductors and imply the possible role of strain gradient in optoelectronic and sensing nano/microdevices.

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Type
research article
DOI
10.1021/nn4062353
Web of Science ID

WOS:000334990600031

Author(s)
Fu, Xuewen
Jacopin, Gwenole  
Shahmohammadi, Mehran  
Liu, Ren
Benameur, Malik
Ganiere, Jean-Daniel  
Feng, Ji
Guo, Wanlin
Liao, Zhi-Min
Deveaud, Benoit  
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Date Issued

2014

Publisher

American Chemical Society

Published in
Acs Nano
Volume

8

Issue

4

Start page

3412

End page

3420

Subjects

ZnO microwire

•

time-resolved cathodoluminescence

•

pure bending strain

•

exciton dynamics

•

strain gradient

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
LOEQ  
Available on Infoscience
June 16, 2014
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/104346
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