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  4. A Fully Integrated Hall Sensor Microsystem for Contactless Current Measurement
 
conference paper

A Fully Integrated Hall Sensor Microsystem for Contactless Current Measurement

Ajbl, Andrea  
•
Pastre, Marc  
•
Kayal, Maher  
2012
2012 Ieee Sensors Proceedings
11th IEEE Sensors Conference

Contactless current measurement based on Hall-effect sensors can be performed in either closed-or open-loop configuration. In this paper an open-loop sensor system with a current-mode output is described. The system measures the magnetic field induced around the current path targeting high linearity, accuracy and speed. As the accuracy of the Hall sensor microsystem is affected by temperature-dependent offset and sensitivity of the sensing element, system-level solutions are developed to minimize these effects. The full system integration represents a design challenge as both voltage and current references are directly involved in the sensitivity calibration and both contribute to the system sensitivity drift. The measurements show a sensitivity drift lower than 80ppm/degrees C, the offset drifts less than 300nT/degrees C and the non-linearity is less than +/- 0.08%. The effects of the varying external field on the calibration loop are analyzed and the theoretical prediction is validated by measurement.

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Type
conference paper
DOI
10.1109/ICSENS.2012.6411298
Web of Science ID

WOS:000315671100489

Author(s)
Ajbl, Andrea  
Pastre, Marc  
Kayal, Maher  
Date Issued

2012

Publisher

Ieee

Publisher place

New York

Published in
2012 Ieee Sensors Proceedings
ISBN of the book

978-1-4577-1766-6

Total of pages

4

Series title/Series vol.

IEEE Sensors

Start page

2046

End page

2049

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
GR-KA  
Event name
11th IEEE Sensors Conference
Available on Infoscience
May 17, 2013
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/92273
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