Repository logo

Infoscience

  • English
  • French
Log In
Logo EPFL, École polytechnique fédérale de Lausanne

Infoscience

  • English
  • French
Log In
  1. Home
  2. Academic and Research Output
  3. Conferences, Workshops, Symposiums, and Seminars
  4. Reliability of MEMS for space applications
 
conference paper

Reliability of MEMS for space applications

Shea, Herbert  
Tanner, Danelle M.
•
Ramesham, Rajeshuni
2006
Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS V
Photonics West 2006: Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS V

With their extremely low mass and volume, low power consumption and tight integration with electronics, MEMS sensors and actuators are extremely appealing for reducing the size and mass of spacecraft without sacrificing functionality. In view of the harsh and remote environment of space, reliability and qualification is the crucial issues that are holding back MEMS from playing a larger role in space applications. We examine how MEMS reliability is handled in commercial MEMS devices used in safety critical applications on earth and contrast the operating conditions on earth with those encountered during launch and in orbit. We explain the impact that vibration, mechanical and thermal shock, and radiation can have on MEMS devices fabricated using the most widespread silicon technologies. Accelerated tests adapted to space qualification are presented as a means to determine the major failure modes. Hermetic packaging is crucial to ensuring long-term reliability.

  • Files
  • Details
  • Metrics
Type
conference paper
DOI
10.1117/12.651008
Web of Science ID

WOS:000237090900010

Author(s)
Shea, Herbert  
Editors
Tanner, Danelle M.
•
Ramesham, Rajeshuni
Date Issued

2006

Published in
Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS V
Series title/Series vol.

Proc. of SPIE; 6111

Start page

61110A

Subjects

MEMS

•

Reliability

•

Space

Note

Invited Paper

Editorial or Peer reviewed

NON-REVIEWED

Written at

EPFL

EPFL units
LMTS  
Event nameEvent placeEvent date
Photonics West 2006: Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS V

San Jose, CA, USA

January 2006

Available on Infoscience
June 23, 2008
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/26369
Logo EPFL, École polytechnique fédérale de Lausanne
  • Contact
  • infoscience@epfl.ch

  • Follow us on Facebook
  • Follow us on Instagram
  • Follow us on LinkedIn
  • Follow us on X
  • Follow us on Youtube
AccessibilityLegal noticePrivacy policyCookie settingsEnd User AgreementGet helpFeedback

Infoscience is a service managed and provided by the Library and IT Services of EPFL. © EPFL, tous droits réservés