Characterizing crystalline defects in single Xe nanoparticles from angular correlations of single-shot diffracted X-rays

Niozu, A.; Kumagai, Y.; Nishiyama, T.; Fukuzawa, H.; Motomura, K.; Bucher, M.; Ito, Y.; Takanashi, T.; Asa, K.; Sato, Y.; You, D.; Li, Y.; Ono, T.; Kukk, E.; Miron, C.; Neagu, L.; Callegari, C.; Di Fraia, M.; Rossi, G.; Galli, D. E.; Pincelli, T.; Colombo, A.; Kameshima, T.; Joti, Y.; Hatsui, T.; Owada, S.; Katayama, T.; Togashi, T.; Tono, K.; Yabashi, M.; Matsuda, K.; Bostedt, C.; Nagaya, K.; Ueda, K.

doi:10.1088/1742-6596/1412/20/202028

conference paper

Characterizing crystalline defects in single Xe nanoparticles from angular correlations of single-shot diffracted X-rays

Niozu, A.

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Kumagai, Y.

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Nishiyama, T.

January 1, 2020

31St International Conference On Photonic, Electronic And Atomic Collisions (Icpeac Xxxi)

31st International Conference on Photonic, Electronic and Atomic Collisions (ICPEAC)

We performed a wide-angle X-ray scattering experiment of single Xe nanoparticles using an X-ray free electron laser. We developed a novel analysis method that focuses on the angular correlation between plural Bragg spots in single-shot diffraction patterns. The angular correlations of the Bragg spots encode rich structural information and offer an evidence of twinning and stacking faults in Xe nanoparticles.