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  4. Axial phase measurements of light interacting with microstructures
 
conference paper

Axial phase measurements of light interacting with microstructures

Kim, Myun-Sik  
•
Scharf, Toralf  
•
Herzig, Hans Peter  
2012
Proceedings of SPIE
SPIE Photonics West

We present an experimental method to study field structures of highly confined light after interaction with microstructures. A high-resolution interference microscope (HRIM) allows us to measure the three-dimensional (3D) amplitude and phase distributions of light emerging from the sample. While the amplitude fields represent conventional pictures of light confinements like a hotspot, the phase fields exhibit peculiar behaviors, which are of significant interest. Longitudinal-differential interferometry can directly visualize and quantify phase deviations in 3D space with respect to a plane wave of the same frequency serving as a reference. The phase fields near the confinement exhibits particular phase features, e.g., axial phase anomaly and superluminal phase velocity. As example of the light interaction with microstructures, two specific optical phenomena have been investigated here: Gouy phase anomaly in the photonic nanojet and superluminal phase propagation of the spot of Arago. For the first time, we could experimentally demonstrate high-resolution axial phase measurements of such phenomena generated by microstructures of wavelengthscale size and at visible light with 642-nm wavelength.

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Type
conference paper
DOI
10.1117/12.905461
Web of Science ID

WOS:000302641100006

Author(s)
Kim, Myun-Sik  
Scharf, Toralf  
Herzig, Hans Peter  
Date Issued

2012

Publisher

Spie-Int Soc Optical Engineering, Po Box 10, Bellingham, Wa 98227-0010 Usa

Published in
Proceedings of SPIE
Series title/Series vol.

Proceedings of SPIE

Volume

8250

Start page

825007

Subjects

Gouy phase anomaly

•

axial phase shift

•

superluminal phase velocity

•

photonic nanojet

•

the spot of Arago

•

high-resolution interference microscope

•

longitudinal-differential interferometry

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
OPT  
Event nameEvent placeEvent date
SPIE Photonics West

San Francisco, California, USA

January 21-26, 2012

Available on Infoscience
March 8, 2012
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/78512
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