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  4. Near-field spectroscopy of a coupled wire-dot nanostructure grown on (311)A GaAs
 
conference paper

Near-field spectroscopy of a coupled wire-dot nanostructure grown on (311)A GaAs

Intonti, F.
•
Emiliani, V.
•
Savona, V.  
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2002
Materials Science And Engineering B-Solid State Materials For Advanced Technology
9th International Conference on Defects: Recognition, Imaging and Physics in Semiconductors (DRIP IX)

We discuss a detailed near-field spectroscopic study of the nanoscopic optical properties of a novel coupled wire-dot nanostructure grown on (31 1)A GaAs substrates. Photoluminescence spectra recorded with 150 mn spatial and 100 mueV spectral resolution permit mapping of two-dimensional variations of the lateral confinement potential and give direct information about growth dynamics. The absence of potential energy barriers between wire and dot makes these dots interesting optical markers for exciton diffusion via quantum well and wire states. The experiments indictate that exciton localization limits both the quasi-two and quasi-one-dimensional mobilities at low temperatures. The statistical parameters of the disorder potential underlying exciton localization, namely its correlation length and disorder amplitude are extracted by means of a novel statistical analysis of the two-energy autocorrelation function of ensembles of near-field PL spectra. (C) 2002 Elsevier Science B.V. All rights reserved.

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Type
conference paper
DOI
10.1016/S0921-5107(01)00953-9
Web of Science ID

WOS:000174864400024

Author(s)
Intonti, F.
Emiliani, V.
Savona, V.  
Runge, E.
Zimmermann, R.
Lienau, C.
Date Issued

2002

Published in
Materials Science And Engineering B-Solid State Materials For Advanced Technology
Volume

91

Start page

105

End page

114

Subjects

Quantum Wires

•

Quantum Dots

•

Near-Field Optics

•

Luminescence Spectroscopy

•

Scanning Optical Microscopy

•

Semiconductor Quantum Wires

•

Wells

•

Excitons

•

Photoluminescence

•

Selectivity

•

Mobilities

•

Transport

•

System

Written at

OTHER

EPFL units
LTPN  
Event nameEvent placeEvent date
9th International Conference on Defects: Recognition, Imaging and Physics in Semiconductors (DRIP IX)

RIMINI, ITALY

SEP 24-28, 2001

Available on Infoscience
September 22, 2009
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/42834
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