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  4. Characterization of Memristive Poly-Si Nanowires via Empirical Physical Modelling
 
conference paper

Characterization of Memristive Poly-Si Nanowires via Empirical Physical Modelling

Archontas, Nikolaos
•
Georgiou, Julius
•
Jamaa, Ben
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2010
Proceedings of the IEEE International Symposium on Circuits and Systems (ISCAS 2010)
IEEE International Symposium on Circuits and Systems (ISCAS)

Memristors are passive circuit elements that behave as resistors with memory. The recently illustrated experimental realization of memristive behaviour of Polysilicon Nanowires has triggered interest in this concept, which is promising to a wide variety of application areas that include neuromorphic circuits. In order to progress with practical implementations that use this technology we need to expand our understanding of the conduction mechanisms in these structures and of the underlying relationship between device behavior and process manufacturing parameters. In this paper we explore these mechanisms through detailed simulation, which includes model calibration and correlation with experimental results. Through fitting of the test results we identify a unique set of density of states that characterize the particular technology implemented.

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Type
conference paper
DOI
10.1109/ISCAS.2010.5537496
Author(s)
Archontas, Nikolaos
Georgiou, Julius
Jamaa, Ben
Haykel, M.  
Carrara, Sandro  
De Micheli, Giovanni  
Date Issued

2010

Published in
Proceedings of the IEEE International Symposium on Circuits and Systems (ISCAS 2010)
Start page

1675

End page

1678

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
LSI1  
Event nameEvent placeEvent date
IEEE International Symposium on Circuits and Systems (ISCAS)

Paris, France

May 30-June 2, 2010

Available on Infoscience
February 11, 2010
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/46613
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