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  4. The Impact of Changes in Resolution on the Persistent Homology of Images
 
conference paper

The Impact of Changes in Resolution on the Persistent Homology of Images

Heiss, Teresa
•
Tymochko, Sarah
•
Story, Brittany
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January 1, 2021
2021 Ieee International Conference On Big Data (Big Data)
9th IEEE International Conference on Big Data (IEEE BigData)

Digital images enable quantitative analysis of material properties at micro and macro length scales, but choosing an appropriate resolution when acquiring the image is challenging. A high resolution means longer image acquisition and larger data requirements for a given sample, but if the resolution is too low, significant information may be lost. This paper studies the impact of changes in resolution on persistent homology, a tool from topological data analysis that provides a signature of structure in an image across all length scales. Given prior information about a function, the geometry of an object, or its density distribution at a given resolution, we provide methods to select the coarsest resolution yielding results within an acceptable tolerance. We present numerical case studies for an illustrative synthetic example and samples from porous materials where the theoretical bounds are unknown.

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Type
conference paper
DOI
10.1109/BigData52589.2021.9671483
Web of Science ID

WOS:000800559503126

Author(s)
Heiss, Teresa
Tymochko, Sarah
Story, Brittany
Garin, Adelie  
Bui, Hoa
Bleile, Bea
Robins, Vanessa
Date Issued

2021-01-01

Publisher

IEEE

Publisher place

New York

Published in
2021 Ieee International Conference On Big Data (Big Data)
ISBN of the book

978-1-6654-3902-2

Series title/Series vol.

IEEE International Conference on Big Data

Start page

3824

End page

3834

Subjects

Computer Science, Artificial Intelligence

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Computer Science, Information Systems

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Computer Science, Theory & Methods

•

Computer Science

•

image processing

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image resolution

•

persistent homology

•

micro-ct images

•

topological persistence

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

Event nameEvent placeEvent date
9th IEEE International Conference on Big Data (IEEE BigData)

ELECTR NETWORK

Dec 15-18, 2021

Available on Infoscience
July 4, 2022
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/189016
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