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research article

Design and characterization of top-emitting microcavity light-emitting diodes

Carlin, J. F.  
•
Royo, P.
•
Stanley, R. P.
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2000
Semiconductor Science and Technology

High-efficiency top-emitting InGaAs/AlGaAs microcavity light-emitting diodes (MCLEDs) have been optimized and fabricated. The structures were grown using molecular beam epitaxy on GaAs substrates. They consist of a three-period Be-doped distributed Bragg reflector (DBR) centred at 950 nm wavelength, a cavity containing three InGaAs quantum wells and a 15-period Si-doped DBR. Different values for the wavelength detuning between the spontaneous emission line and Fabry-Perot cavity mode were explored, between -40 nm and +10 nm. Devices sizes ranged from 22 x 22 mu m(2) to 420 x 420 mu m(2). As expected from simulations, the higher efficiencies are obtained when the detuning is in the -20 to 0 nm range. The devices exhibit up to 10% external quantum efficiency, measured for a 62 degrees collection half-angle. After correction for the surface shadowing due to the grid p-contact, the maximum efficiency increases to 14% and is practically independent of device size. 0.5% external quantum efficiency (1.5% when corrected for shadowing) was achieved for light butt coupled directly into a 100 mu m diameter silica fibre.

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Type
research article
DOI
10.1088/0268-1242/15/2/312
Author(s)
Carlin, J. F.  
Royo, P.
Stanley, R. P.
Houdré, R.  
Spicher, J.
Oesterle, U.  
Ilegems, M.  
Date Issued

2000

Published in
Semiconductor Science and Technology
Volume

15

Issue

2

Start page

145

End page

154

Subjects

EMISSION

Editorial or Peer reviewed

REVIEWED

Written at

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Available on Infoscience
October 5, 2010
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/55041
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