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research article

Corrugated membranes for improved pattern definition with micro/nanostencil lithography

van den Boogaart, M A F  
•
Lishchynska, M
•
Doeswijk, L M
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2006
Sensors and Actuators A: Physical

We present a MEMS process for the fabrication of arbitrary (adaptable to specific aperture geometries) stabilization of silicon nitride membranes to be used as miniature shadow masks or (nano) stencils. Stabilization was realized by the fabrication of silicon nitride corrugated support structures integrated into large-area thin-film solid-state membranes. These corrugated support structures are aimed to reduce the membrane deformation due to the deposition-induced stress and thus to improve the dimensional control over the surface patterns created by stencil lithography. We have performed physical vapor deposition (PVD) of chromium on unstabilized (standard) stencil membranes and on stabilized (corrugated) stencil membranes to test the proposed stabilization geometry. Both the membrane deformation and the surface structures were analyzed, showing reduced deformation and improved pattern definition for the stabilized stencil membranes. The structures have been modeled using a commercial finite element method (FEM) software tool. The simulation and experimental results confirm that introducing stabilization structures in the membrane can significantly (up to 94%) reduce out-of-plane deformations of the membrane. The results of this study can be applied as a guideline for the design and fabrication of mechanically stable, complex stencil membranes for direct deposition.

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Type
research article
DOI
10.1016/j.sna.2005.08.037
Web of Science ID

WOS:000239295000078

Author(s)
van den Boogaart, M A F  
•
Lishchynska, M
•
Doeswijk, L M
•
Greer, J C
•
Brugger, J  
Date Issued

2006

Published in
Sensors and Actuators A: Physical
Volume

130-131

Start page

568

End page

574

Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
LMIS1  
Available on Infoscience
July 14, 2006
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/232608
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