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research article

Advanced Scanning Probes for Micro-Nano Science Researches

Akiyama, Terunobu  
•
Gautsch, Sebastian  
•
Parrat, Daniel
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2010
IEEJ Transactions On Electrical And Electronic Engineering

In this study, we introduce five unique scanning vibes developed in our laboratory for different fields of application These probes are the results of excellent collaborations with many external partners Each probe possesses many advanced features that one can hardly obtain with plane probes for conventional optical deflection system The applications of these probes are very versatile. from atomic force microscope for the exploration of Mars to In vivo measurements of human knee cartilage (C) 2010 Institute of Electrical Engineers of Japan Published by John Wiley & Sons. Inc

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Type
research article
DOI
10.1002/tee.20527
Web of Science ID

WOS:000277128900001

Author(s)
Akiyama, Terunobu  
Gautsch, Sebastian  
Parrat, Daniel
Imer, Raphael
Vettiger, Peter
Staufer, Urs
de Rooij, Nicolaas F.  
Date Issued

2010

Publisher

Wiley-Blackwell

Published in
IEEJ Transactions On Electrical And Electronic Engineering
Volume

5

Start page

259

End page

262

Subjects

Afm

•

cantilever

•

conductive probe

•

piezoresistive probe self-sensing probe

•

array probe

•

Atomic-Force Microscopy

•

Quartz Tuning Fork

•

Cantilever

Editorial or Peer reviewed

NON-REVIEWED

Written at

EPFL

EPFL units
SAMLAB  
Available on Infoscience
May 19, 2010
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/50137
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