Skip to main content
Infoscience
English
French
Log In
Log in with EPFL account
Log in with local account
Infoscience
English
French
Log In
Log in with EPFL account
Log in with local account
Home
Academic and Research Output
Conferences, Workshops, Symposiums, and Seminars
Gate-all-around MOSFETs: true fabrication and characteristics
conference paper
Gate-all-around MOSFETs: true fabrication and characteristics
Pott, V.
•
Bouvet, D.
•
Moselund, K. E.
Show more
2006
SINANO workshop on silicon nanodevices, Beyond CMOS: Emerging devices
Details
Metrics