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  4. Gate-all-around MOSFETs: true fabrication and characteristics
 
conference paper

Gate-all-around MOSFETs: true fabrication and characteristics

Pott, V.  
•
Bouvet, D.  
•
Moselund, K. E.  
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2006
SINANO workshop on silicon nanodevices, Beyond CMOS: Emerging devices
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