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research article

Amphoteric defects in GaAs leading to Fermi-level pinning: A hybrid functional study

Colleoni, Davide  
•
Pasquarello, Alfredo  
2013
Microelectronic Engineering

Formation energies and charge transition levels of amphoteric defects in GaAs giving rise to Fermi-level pinning are calculated with hybrid functionals. The hybrid functional results indicate that previously identified defects involving the bistable nature of Ga and As vacancies cannot account for the experimentally observed pinning at 0.6 eV in damaged bulk GaAs. A stable defect complex involving an extra As antisite bound to a Ga vacancy is identified and shown to possess bistable and amphoteric behavior leading to Fermi-level pinning in accord with experiment. (C) 2013 Elsevier B.V. All rights reserved.

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Type
research article
DOI
10.1016/j.mee.2013.03.068
Web of Science ID

WOS:000321229200015

Author(s)
Colleoni, Davide  
Pasquarello, Alfredo  
Date Issued

2013

Publisher

Elsevier

Published in
Microelectronic Engineering
Volume

109

Start page

50

End page

53

Subjects

GaAs

•

Amphoteric defect

•

Fermi-level pinning

•

Hybrid functional

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
CSEA  
Available on Infoscience
October 1, 2013
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/95588
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