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  4. Multi-scale Feature Extraction on Point-Sampled Surfaces
 
conference paper

Multi-scale Feature Extraction on Point-Sampled Surfaces

Pauly, Mark  
•
Keiser, Richard
•
Gross, Markus
2003
Computer Graphics Forum
Computer Graphics Forum

We present a new technique for extracting line-type features on point-sampled geometry. Given an unstructured point cloud as input, our method first applies principal component analysis on local neighborhoods to classify points according to the likelihood that they belong to a feature. Using hysteresis thresholding, we then compute a minimum spanning graph as an initial approximation of the feature lines. To smooth out the features while maintaining a close connection to the underlying surface, we use an adaptation of active contour models. Central to our method is a multi-scale classification operator that allows feature analysis at multiple scales, using the size of the local neighborhoods as a discrete scale parameter. This significantly improves the reliability of the detection phase and makes our method more robust in the presence of noise. To illustrate the usefulness of our method, we have implemented a non-photorealistic point renderer to visualize point-sampled surfaces as line drawings of their extracted feature curves.

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Type
conference paper
DOI
10.1111/1467-8659.00675
Author(s)
Pauly, Mark  
Keiser, Richard
Gross, Markus
Date Issued

2003

Published in
Computer Graphics Forum
Volume

22

Issue

3

Start page

281

End page

289

Subjects

Approximation theory

•

Computational geometry

•

Curve fitting

•

Graph theory

•

Parameter estimation

•

Principal component analysis

Editorial or Peer reviewed

REVIEWED

Written at

OTHER

EPFL units
GCM  
Event nameEvent place
Computer Graphics Forum

Granada, Spain

Available on Infoscience
June 14, 2010
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/50805
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