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research article

A random-resistor network model of voltage trimming

Grimaldi, Claudio  
•
Maeder, Thomas  
•
Ryser, Peter  
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2004
Journal of Physics D

In industrial applications, the controlled adjustment (trimming) of resistive elements via the application of high voltage pulses is a promising technique, with several advantages with respect to more classical approaches such as the laser cutting method. The microscopic processes governing the response to high voltage pulses depend on the nature of the resistor and on the interaction with the local environment. Here we provide a theoretical statistical description of voltage discharge effects on disordered composites by considering random resistor network models with different properties and processes due to the voltage discharge. We compare standard percolation results with biased percolation effects and provide a tentative explanation of the different scenarios observed during trimming processes.

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Type
research article
DOI
10.1088/0022-3727/37/15/019
Web of Science ID

WOS:000223510100019

Author(s)
Grimaldi, Claudio  
Maeder, Thomas  
Ryser, Peter  
Strässler, Sigfrid
Date Issued

2004

Published in
Journal of Physics D
Volume

37

Start page

2170

End page

2174

Subjects

Technologie des couches épaisses

•

résistances

•

thick-film resistors

•

ajustement électrique

•

impulsions haute tension

•

high-voltage pulses

•

theory

•

models

Note

Article théorique sur l’ajustement par impulsions électriques de résistances.

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
LPM  
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/232051
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