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  4. Temperature Impact on Remote Power Side-Channel Attacks on Shared FPGAs
 
conference paper

Temperature Impact on Remote Power Side-Channel Attacks on Shared FPGAs

Glamocanin, Ognjen  
•
Bazaz, Hajira
•
Payer, Mathias  
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April 19, 2023
2023 Design, Automation & Test In Europe Conference & Exhibition, Date
Design, Automation and Test in Europe Conference DATE 2023

To answer the growing demand for hardware acceleration, Amazon, Microsoft, and many other major cloud service providers have included field-programmable gate arrays (FPGAs) in their datacenters. However, researchers have shown that cloud FPGAs, when shared between multiple tenants, face the threat of remote power side-channel analysis (SCA) attacks. FPGA time-to-digital converter (TDC) sensors enable adversaries to sense voltage fluctuations and, in turn, break cryptographic implementations or extract confidential information with the help of machine learning (ML). The operating temperature of the TDC sensor affects the traces it acquires, but its impact on the success of remote power SCA attacks has largely been ignored in literature. This paper attempts to fill in this gap. We focus on two attack scenarios: correlation power analysis (CPA) and ML-based profiling attacks. We show that the temperature impacts the success of the remote power SCA attacks: with the ambient temperature increasing, the success rate of the CPA attack decreases. In-depth analysis reveals that TDC sensor measurements suffer from temperature dependent effects, which, if ignored, can lead to misleading and overly optimistic results of ML-based profiling attacks. We evaluate and stress the importance of following power side-channel trace acquisition guidelines for minimizing the temperature effects and, consequently, obtaining a more realistic measure of success for remote ML-based profiling attacks.

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Type
conference paper
DOI
10.23919/DATE56975.2023.10136979
Author(s)
Glamocanin, Ognjen  
Bazaz, Hajira
Payer, Mathias  
Stojilovic, Mirjana
Date Issued

2023-04-19

Publisher

IEEE

Publisher place

New York

Published in
2023 Design, Automation & Test In Europe Conference & Exhibition, Date
ISBN of the book

979-8-3503-9624-9

Total of pages

6

Series title/Series vol.

Design Automation and Test in Europe Conference and Exhibition

Subjects

FPGA

•

multitenancy

•

machine learning

•

side-channel attacks

•

temperature

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
PARSA  
Event nameEvent placeEvent date
Design, Automation and Test in Europe Conference DATE 2023

Antwerp, Belgium

April 17-19, 2023

Available on Infoscience
February 7, 2023
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/194683
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