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research article

Mechanical integrity of hybrid indium-free electrodes for flexible devices

Dauzou, Fabien
•
Bouten, Piet C. P.
•
Dabirian, Ali  
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2016
Organic Electronics

Maintaining electrical conductivity, optical transparency, and mechanical integrity against bending and stretching are key requirements for flexible transparent electrodes. Transparent conducting oxides (TCOs) are widely used thin film electrodes in optoelectronic devices. However, these materials are brittle and reducing film thickness to improve their mechanical integrity compromises their electrical performance. Here we combine TCO thin films with metal grids embedded in a polymer substrate to create hybrid electrodes with low sheet resistance and high resilience to bending. Amorphous zinc tin oxide (ZTO) and aluminum-doped zinc oxide (AZO) films sputtered onto polyethylene-terephthalate (PET) substrates with and without embedded metal grids are studied. The hybrid electrodes have an optical absorptance below 5% in the visible range and their electrical sheet resistance is less than 1 Omega/sq. The critical strain for tensile failure is analyzed through a combination of electrical measurements and in-situ observations of crack initiation and propagation during tensile loading. The mean critical strain for failure of the AZO/metal grid is 8.5% and that of the ZTO/metal grid is as high as 10%. The AZO and ZTO films alone present critical strain values around 0.6% and 1% respectively, demonstrating that the addition of the metal grid considerably improves the resistance onset strain of the electrodes far beyond these critical strain limits. (C) 2016 Elsevier B.V. All rights reserved.

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Type
research article
DOI
10.1016/j.orgel.2016.05.016
Web of Science ID

WOS:000377409800019

Author(s)
Dauzou, Fabien
Bouten, Piet C. P.
Dabirian, Ali  
Leterrier, Yves  
Ballif, Christophe  
Morales-Masis, Monica
Date Issued

2016

Publisher

Elsevier

Published in
Organic Electronics
Volume

35

Start page

136

End page

141

Subjects

Stretchable electrode

•

Amorphous transparent conductive oxide

•

Mechanical test

•

Indium-free

Note

IMT Number : 865

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

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Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/127517
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