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research article

Three-dimensional nano-localization of single fluorescent emitters

Märki, Iwan  
•
Bocchio, Noelia  
•
Geissbühler, Stefan  
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2010
Optics Express

We present a combination of self-interference microscopy with lateral super-resolution microscopy and introduce a novel approach for localizing a single nano-emitter to within a few nanometers in all three dimensions over a large axial range. We demonstrate nanometer displacements of quantum dots placed on top of polymer bilayers that undergo swelling when changing from an air to a water environment, achieving standard deviations below 10 nm for axial and lateral localization.

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Type
research article
DOI
10.1364/OE.18.020263
Web of Science ID

WOS:000281779600063

Author(s)
Märki, Iwan  
Bocchio, Noelia  
Geissbühler, Stefan  
Aguet, François
Bilenca, Alberto  
Lasser, Theo  
Date Issued

2010

Publisher

Optical Society of America

Published in
Optics Express
Volume

18

Issue

19

Start page

20263

End page

20272

Subjects

Micorscopy

•

Fluorescence microscopy

•

Spectroscopy

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
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Available on Infoscience
September 10, 2010
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/53564
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