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  4. The Combined Effect of Process Variations and Power Supply Noise on Clock Skew and Jitter
 
conference paper

The Combined Effect of Process Variations and Power Supply Noise on Clock Skew and Jitter

Xu, Hu  
•
Pavlidis, Vasileios  
•
Burleson, Wayne  
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2012
Proceedings of IEEE International Symposium on Quality Electronic Design (ISQED)
IEEE International Symposium on Quality Electronic Design (ISQED)

In modern VLSI circuits, a large number of clock buffers are inserted in clock distribution networks, which are significantly affected by process and power supply noise variations. The combined effect of process variations and power supply noise on clock skew and jitter is investigated in this paper. A statistical model of skew and jitter is proposed. Clock paths with different buffer insertion strategies are compared in terms of skew and jitter. The tradeoffs among the constraints on clock jitter, skew, slew rate, and power are discussed. For strict timing constraints, severe power overhead (> 110%) has to be added to obtain a low improvement in the worst case skitter and slew rate (<13%). The effect of widely-used techniques, such as recombinant trees and dynamic voltage scaling, on decreasing skitter is also investigated.

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Type
conference paper
DOI
10.1109/ISQED.2012.6187512
Web of Science ID

WOS:000309266000045

Author(s)
Xu, Hu  
Pavlidis, Vasileios  
Burleson, Wayne  
De Micheli, Giovanni  
Date Issued

2012

Publisher

Ieee

Publisher place

New York

Published in
Proceedings of IEEE International Symposium on Quality Electronic Design (ISQED)
ISBN of the book

978-1-4673-1036-9

Total of pages

8

Series title/Series vol.

International Symposium on Quality Electronic Design

Start page

320

End page

327

Subjects

clock distribution network

•

clock jitter

•

clock skew

•

skitter

•

process variations

•

power supply noise

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
LSI1  
Event nameEvent placeEvent date
IEEE International Symposium on Quality Electronic Design (ISQED)

Santa Clara, California, USA

March 19-21, 2012

Available on Infoscience
May 7, 2012
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/80116
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