Repository logo

Infoscience

  • English
  • French
Log In
Logo EPFL, École polytechnique fédérale de Lausanne

Infoscience

  • English
  • French
Log In
  1. Home
  2. Academic and Research Output
  3. Conferences, Workshops, Symposiums, and Seminars
  4. The Combined Effect of Process Variations and Power Supply Noise on Clock Skew and Jitter
 
conference paper

The Combined Effect of Process Variations and Power Supply Noise on Clock Skew and Jitter

Xu, Hu  
•
Pavlidis, Vasileios  
•
Burleson, Wayne  
Show more
2012
Proceedings of IEEE International Symposium on Quality Electronic Design (ISQED)
IEEE International Symposium on Quality Electronic Design (ISQED)

In modern VLSI circuits, a large number of clock buffers are inserted in clock distribution networks, which are significantly affected by process and power supply noise variations. The combined effect of process variations and power supply noise on clock skew and jitter is investigated in this paper. A statistical model of skew and jitter is proposed. Clock paths with different buffer insertion strategies are compared in terms of skew and jitter. The tradeoffs among the constraints on clock jitter, skew, slew rate, and power are discussed. For strict timing constraints, severe power overhead (> 110%) has to be added to obtain a low improvement in the worst case skitter and slew rate (<13%). The effect of widely-used techniques, such as recombinant trees and dynamic voltage scaling, on decreasing skitter is also investigated.

  • Files
  • Details
  • Metrics
Loading...
Thumbnail Image
Name

ISQED_12.pdf

Access type

openaccess

Size

1.93 MB

Format

Adobe PDF

Checksum (MD5)

6045b9b1608146d930417e841b9e30be

Logo EPFL, École polytechnique fédérale de Lausanne
  • Contact
  • infoscience@epfl.ch

  • Follow us on Facebook
  • Follow us on Instagram
  • Follow us on LinkedIn
  • Follow us on X
  • Follow us on Youtube
AccessibilityLegal noticePrivacy policyCookie settingsEnd User AgreementGet helpFeedback

Infoscience is a service managed and provided by the Library and IT Services of EPFL. © EPFL, tous droits réservés