conference paper
Enhanced Wafer Matching Heuristics for 3-D ICs
2012
Proceedings of the IEEE 17th European Test Symposium
Type
conference paper
Web of Science ID
WOS:000309227500033
Author(s)
Date Issued
2012
Publisher
Publisher place
New York
Published in
Proceedings of the IEEE 17th European Test Symposium
ISBN of the book
978-1-4673-0697-3
Total of pages
1
Series title/Series vol.
Proceedings of the European Test Symposium
Start page
178
Editorial or Peer reviewed
REVIEWED
Written at
EPFL
EPFL units
| Event name | Event place | Event date |
Annecy, France | May 28- June 1, 2012 | |
Available on Infoscience
July 20, 2012
Use this identifier to reference this record