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  4. Multiwavelength High Resolution Interference Microscopy (HRIM) for the characterization of small size microlenes
 
conference presentation

Multiwavelength High Resolution Interference Microscopy (HRIM) for the characterization of small size microlenes

Kim, Myun Sik  
•
Scharf, Toralf  
•
Herzig, Hans Peter  
2010
Annual Conference of Association des Scientiques Coréens en France (ASCoF)
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Type
conference presentation
Author(s)
Kim, Myun Sik  
Scharf, Toralf  
Herzig, Hans Peter  
Date Issued

2010

Written at

EPFL

EPFL units
OPT  
Event nameEvent placeEvent date
Annual Conference of Association des Scientiques Coréens en France (ASCoF)

Rennes, France

May 14, 2010

Available on Infoscience
December 13, 2010
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/62086
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