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research article

Influence of the bias-dependent emission zone on exciton quenching and OLED efficiency

Regnat, Markus  
•
Pernstich, Kurt P.
•
Ruhstaller, Beat
July 1, 2019
Organic Electronics

We present an electro-optical model of a three-layer phosphorescent OLED which accurately describes the measured current efficiency and transient electroluminescence decay for different biases. Central findings are a bias-dependent emission zone, which influences light outcoupling as well as exciton quenching, and the presence of strong triplet-polaron quenching even at low bias. The measured current efficiency initially increases up to 9 V before it decreases, where the increase is found to be caused by reduced triplet-polaron quenching with holes, while the decrease is caused by a reduced light outcoupling and increased triplet-triplet annihilation. The numerical model allows identifying the individual contributions of the exciton continuity equation and explains the electroluminescence decay, which deviates significantly from a mono-exponential decay due to the dominating influence of exciton generation and quenching after the external bias is removed.

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Influence of the bias-dependent emission zone on exciton quenching and OLED efficiency.pdf

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http://purl.org/coar/version/c_970fb48d4fbd8a85

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openaccess

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CC BY

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03148d74f56b5bd7c0cdf7ab39857c75

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