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  4. Optically Probed Time Dynamics of χ(2) Grating Inscription in SiN Waveguides
 
conference paper

Optically Probed Time Dynamics of χ(2) Grating Inscription in SiN Waveguides

Nitiss, Edgars  
•
Liu, Tianyi  
•
Kippenberg, Tobias  
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October 17, 2019
Proceedings of the 2019 Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC)
2019 Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC)

Silicon Nitride (S13N4) waveguide platforms have seen significant interest in the recent years, motivated by several advantageous properties such as compatibility with CMOS fabrication standards, low propagation loss, high refractive index and optical nonlinearity suggesting multiple applications in integrated linear and nonlinear optics. Unfortunately, Si 3 N 4 does not exhibit second order nonlinear optical properties due to its amorphous nature. Yet, recently several groups showed a build-up in time of a second harmonic (SH) when a pulsed high power pump is coupled in an Si3N waveguide [1-3]. This phenomenon, referred to as all-optical poling, is explained by the growth of an harmonic space-charge modulated χ (2) grating which quasi-phase matches the pump and its SH [4].

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Type
conference paper
DOI
10.1109/CLEOE-EQEC.2019.8871462
Author(s)
Nitiss, Edgars  
Liu, Tianyi  
Kippenberg, Tobias  
Grassani, Davide  
Brès, Camille Sophie  
Date Issued

2019-10-17

Published in
Proceedings of the 2019 Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC)
ISBN of the book

978-1-7281-0469-0

Start page

1

End page

1

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
PHOSL  
LPQM  
Event nameEvent placeEvent date
2019 Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC)

Munich, Germany

June 23-27, 2019

Available on Infoscience
February 6, 2020
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/165173
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