conference paper
Charge pulse detection with minimum noise for energy-sensitive single-photon X-ray sensing
2009
Proceedings of the EOS Conference on the Frontiers in Electronic Imaging
A novel charge pulse detection circuit is presented, consisting of a continuous reset resistor in series with the charge pulse generator, followed by a simple amplifier and pulse shaping circuit. Realization with a 0.18 μm CMOS process (UMC) will result in input-referred charge noise of less than 30 electrons r.m.s. at room temperature, corresponding to an energy resolution in single-photon X-ray sensing of about 110 eV.
Type
conference paper
Author(s)
Lotto, Christian
Date Issued
2009
Published in
Proceedings of the EOS Conference on the Frontiers in Electronic Imaging
Editorial or Peer reviewed
REVIEWED
Written at
EPFL
EPFL units
| Event name | Event place | Event date |
Munich, Germany | June 15-16, 2009 | |
Use this identifier to reference this record