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  4. Wide-baseline Stereo from Multiple Views: a Probabilistic Account
 
conference paper

Wide-baseline Stereo from Multiple Views: a Probabilistic Account

Strecha, Christoph  
•
Fransen, Rik
•
Van Gool, Luc
2004
Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition
IEEE Conference on Computer Vision and Pattern Recognition

This paper describes a method for dense depth reconstruction from a small set of wide-baseline images. In a widebaseline setting an inherent difficulty which complicates the stereo-correspondence problem is self-occlusion. Also, we have to consider the possibility that image pixels in different images, which are projections of the same point in the scene, will have different color values due to non-Lambertian effects or discretization errors. We propose a Bayesian approach to tackle these problems. In this framework, the images are regarded as noisy measurements of an underlying ’true’ image-function. Also, the image data is considered incomplete, in the sense that we do not know which pixels from a particular image are occluded in the other images. We describe an EM-algorithm, which iterates between estimating values for all hidden quantities, and optimizing the current depth estimates. The algorithm has few free parameters, displays a stable convergence behavior and generates accurate depth estimates. The approach is illustrated with several challenging real-world examples. We also show how the algorithm can generate realistic view interpolations and how it merges the information of all images into a new, synthetic view.

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Type
conference paper
DOI
10.1109/CVPR.2004.1315080
Author(s)
Strecha, Christoph  
Fransen, Rik
Van Gool, Luc
Date Issued

2004

Published in
Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition
Volume

2

Start page

552

End page

559

Subjects

multi-view stereo

•

novel view generation

URL

URL

http://cvl.umiacs.umd.edu/conferences/cvpr2004/
Editorial or Peer reviewed

REVIEWED

Written at

OTHER

EPFL units
CVLAB  
Event nameEvent placeEvent date
IEEE Conference on Computer Vision and Pattern Recognition

Washington

June 27 - July 2, 2004

Available on Infoscience
October 7, 2008
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/30155
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