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conference paper

A novel RF MEMS technological platform

Fritschi, R.  
•
Dehollain, C.
•
Declercq, M.  
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2002
Proceedings of the IEEE 28th Annual Conference of the Industrial Electronics Society (IECON 02)
28th Annual Conference of the IEEE Industrial-Electronics-Society

A novel MEMS technological platform for RF passive components, namely RF MEMS switches, tuneable capacitors and high-Q suspended inductors, is reported. The proposed process employs a metal (Al, AlSi or Cu) as active movable layer and amorphous silicon or polycrystalline silicon as sacrificial layers, providing multi-air-gaps. Various types of substrates like bulk silicon and SOI can be used. Full-dry releasing of suspended beams and membranes is performed with SF_6 or XeF_2, with unrivalled yield/reproducibility compared with any other wet etching techniques. The platform is used to validate new MEMS architectures and concepts, such as the suspended-gate MOSFET that can serve as both RF capacitive switches and tuneable RF capacitors.

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Type
conference paper
DOI
10.1109/IECON.2002.1182883
Web of Science ID

WOS:000181518100534

Author(s)
Fritschi, R.  
Dehollain, C.
Declercq, M.  
Ionescu, A. M.  
Hibert, C.  
Flückiger, Ph.  
Renaud, Philippe  
Date Issued

2002

Published in
Proceedings of the IEEE 28th Annual Conference of the Industrial Electronics Society (IECON 02)
Volume

4

Start page

3052

End page

3056

Subjects

Al

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AlSi

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Cu

•

RF MEMS switches

•

RF MEMS technological platform

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RF capacitive switches

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RF passive components

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SOI

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Si

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active movable layer

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amorphous silicon

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high-Q suspended inductors

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membranes

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multi-air-gaps

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polycrystalline silicon

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sacrificial layers

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substrates

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suspended beams

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suspended-gate MOSFET

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tuneable RF capacitors

•

tuneable capacitors

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SF6

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XeF2

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MOSFET

•

aluminium

•

aluminium alloys

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amorphous semiconductors

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capacitors

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copper

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elemental semiconductors

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field effect transistor switches

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inductors

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microswitches

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silicon

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silicon alloys

•

substrates

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

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Event nameEvent placeEvent date
28th Annual Conference of the IEEE Industrial-Electronics-Society

Seville, Spain

Nov. 05-08, 2002

Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/218176
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