Imaging the (sub)micron scale over large areas with high temporal resolution becomes increasingly necessary for the development and investigation of novel materials under realistic operation conditions. Small angle x-ray scattering imaging methods provide micro- and nanoscale structural information of materials. A fundamental shortcoming of such methods is the long acquisition time required to investigate macroscopic objects. In this work, we propose a single shot imaging method that allows reciprocal space sensitivity at a local level while maintaining spatial resolution for imaging macroscopic objects. We use an instrument that is sensitive to the ultrasmall angle x-ray scattering range and utilize it to image unstable polydisperse particle systems. This allows us to observe in real time the evolution of the local average particle diameter due to the stratification of the microparticles.