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research article

Defect segmentation for multi-illumination quality control systems

Honzátko, David
•
Türetken, Engin
•
Arjomand Bigdeli, Siavash  
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September 23, 2021
Machine Vision and Applications

Thanks to recent advancements in image processing and deep learning techniques, visual surface inspection in production lines has become an automated process as long as all the defects are visible in a single or a few images. However, it is often necessary to inspect parts under many different illumination conditions to capture all the defects. Training deep networks to perform this task requires large quantities of annotated data, which are rarely available and cumbersome to obtain. To alleviate this problem, we devised an original augmentation approach that, given a small image collection, generates rotated versions of the images while preserving illumination effects, something that random rotations cannot do. We introduce three real multi-illumination datasets, on which we demonstrate the effectiveness of our illumination preserving rotation approach. Training deep neural architectures with our approach delivers a performance increase of up to 51% in terms of AuPRC score over using standard rotations to perform data augmentation.

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Type
research article
DOI
10.1007/s00138-021-01244-z
Author(s)
Honzátko, David
Türetken, Engin
Arjomand Bigdeli, Siavash  
Dunbar, L. Andrea
Fua, Pascal  
Date Issued

2021-09-23

Published in
Machine Vision and Applications
Volume

32

Issue

118

Start page

16

Subjects

Defect detection

•

Multi-illumination

•

Deep learning

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Data augmentation

•

Photometric stereo

•

Quality control

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
CVLAB  
Available on Infoscience
September 24, 2021
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/181582
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