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  4. FREAK: Fast Retina Keypoint
 
conference paper

FREAK: Fast Retina Keypoint

Alahi, Alexandre  
•
Ortiz, Raphaël  
•
Vandergheynst, Pierre  
2012
IEEE Conference on Computer Vision and Pattern Recognition
IEEE Conference on Computer Vision and Pattern Recognition

A large number of vision applications rely on matching keypoints across images. The last decade featured an arms-race towards faster and more robust keypoints and association algorithms: Scale Invariant Feature Transform (SIFT), Speed-up Robust Feature (SURF), and more recently Binary Robust Invariant Scalable Keypoints (BRISK) to name a few. These days, the deployment of vision algorithms on smart phones and embedded devices with low memory and computation complexity has even upped the ante: the goal is to make descriptors faster to compute, more compact while remaining robust to scale, rotation and noise. To best address the current requirements, we propose a novel keypoint descriptor inspired by the human visual system and more precisely the retina, coined Fast Retina Keypoint (FREAK). A cascade of binary strings is computed by efficiently comparing image intensities over a retinal sampling pattern. Our experiments show that FREAKs are in general faster to compute with lower memory load and also more robust than SIFT, SURF or BRISK. They are thus competitive alternatives to existing keypoints in particular for embedded applications.

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Type
conference paper
DOI
10.1109/CVPR.2012.6247715
Web of Science ID

WOS:000309166200065

Author(s)
Alahi, Alexandre  
Ortiz, Raphaël  
Vandergheynst, Pierre  
Date Issued

2012

Publisher

Ieee

Publisher place

New York

Published in
IEEE Conference on Computer Vision and Pattern Recognition
ISBN of the book

978-1-4673-1228-8

Total of pages

8

Series title/Series vol.

IEEE Conference on Computer Vision and Pattern Recognition

Start page

510

End page

517

Subjects

Keypoint

•

image matching

•

binary descriptor

•

retina

•

lts2

•

award

Note

CVPR 2012 Open Source Award Winner

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
LTS2  
VITA  
Event nameEvent placeEvent date
IEEE Conference on Computer Vision and Pattern Recognition

Rhode Island, Providence, USA

June 16-21, 2012

Available on Infoscience
March 9, 2012
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/78558
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