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review article

Super-resolution optical imaging: A comparison

Huszka, Gergely
•
Gijs, Martin A. M.  
March 1, 2019
Micro And Nano Engineering

Overcoming the classical diffraction limit in optical microscopy is known to be achievable by a variety of far-field and near-field microscopy techniques. More recently, so-called micro-object-based optical super-resolution microscopy techniques have emerged. In this review, we provide an overview of the state-of-the-art of optical super-resolution imaging techniques. In the first section, far-field techniques are discussed, which can be considered as advanced classical optical microscopy methods that mostly operate with fluorescent samples. In the second section, near-field techniques are presented that achieve super-resolution by maintaining a close distance between a nanometric detection unit and the sample, such that evanescent waves can be captured and processed. Near-field methods typically involve some scanning procedure to be able to map a reasonably large area of the sample. In the third section, dielectricmicro-object-based techniques are discussed. These provide amore recent, practical and affordable alternative to the other super-resolution microscopies. Finally, we provide a comparison of the presented techniques in terms of performance and cost, pointing out the application-specific strength of each imaging method. (c) 2018 The Authors. Published by Elsevier B.V. This is an open access article under the CC BY-NC-ND license (http://creativecommons.org/licenses/by-nc-nd/4.0/).

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Type
review article
DOI
10.1016/j.mne.2018.11.005
Web of Science ID

WOS:000579769300002

Author(s)
Huszka, Gergely
Gijs, Martin A. M.  
Date Issued

2019-03-01

Published in
Micro And Nano Engineering
Volume

2

Start page

7

End page

28

Subjects

optical super-resolution microscopy

•

far-field imaging

•

near-field imaging

•

micro-objects

•

microspheres

•

photonic nanojet

•

ground-state-depletion

•

near-field optics

•

photonic-nanojets

•

fluorescence microscopy

•

lateral resolution

•

3-dimensional superresolution

•

illumination microscopy

•

diffraction-limit

•

light

•

localization

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
LMIS2  
Available on Infoscience
November 5, 2020
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/172967
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