Repository logo

Infoscience

  • English
  • French
Log In
Logo EPFL, École polytechnique fédérale de Lausanne

Infoscience

  • English
  • French
Log In
  1. Home
  2. Academic and Research Output
  3. Journal articles
  4. Tunnel FET with non-uniform gate capacitance for improved device and circuit level performance
 
research article

Tunnel FET with non-uniform gate capacitance for improved device and circuit level performance

Alper, Cem  
•
De Michielis, L.  
•
Dağtekin, N.
Show more
2013
Solid-State Electronics

We report the significant improvement obtained by a non-uniform gate capacitance made by appropriate combination of high-k and low-k regions over the tunneling and the channel regions of a heterostucture TFET (called HKLKFFET). In addition to significantly enhanced ION and subthreshold swing, we find that this structure offers great improvements for the dynamic switching energy (66% saving) and propagation delay (similar to 3 x fast operation) compared to a heterostructure TFET (HeTFET) due to the reduction of the Miller effect. We compare and benchmark the proposed device against a 65 nm low stand-by power (LSTP) CMOS technology, and we show that at a supply voltage of V-DD = 0.4 V, TFETs can have smaller propagation delays compared to CMOS operating in the subthreshold region. Higher cut-off frequency (similar to 3x) and bandwidth for analog applications is observed in circuit-level simulations. (C) 2013 Elsevier Ltd. All rights reserved.

  • Files
  • Details
  • Metrics
Type
research article
DOI
10.1016/j.sse.2013.02.032
Web of Science ID

WOS:000319547100029

Author(s)
Alper, Cem  
De Michielis, L.  
Dağtekin, N.
Lattanzio, L.  
Bouvet, D.  
Ionescu, A. M.  
Date Issued

2013

Publisher

Elsevier

Published in
Solid-State Electronics
Volume

84

Start page

205

End page

210

Subjects

Tunnel Field-Effect Transistor (TFET)

•

Oxide capacitance

•

High-k oxide

•

Finite element simulation

Editorial or Peer reviewed

NON-REVIEWED

Written at

EPFL

EPFL units
NANOLAB  
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/90451
Logo EPFL, École polytechnique fédérale de Lausanne
  • Contact
  • infoscience@epfl.ch

  • Follow us on Facebook
  • Follow us on Instagram
  • Follow us on LinkedIn
  • Follow us on X
  • Follow us on Youtube
AccessibilityLegal noticePrivacy policyCookie settingsEnd User AgreementGet helpFeedback

Infoscience is a service managed and provided by the Library and IT Services of EPFL. © EPFL, tous droits réservés