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research article

Stress and aging minimization in photoplastic AFM probes

Martin, Cristina
•
Llobera, A.
•
Villanueva, Guillermo  
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2009
Microelectronic Engineering

Photostructurable epoxy based resists, like SU-8, are soft materials with a Young’s Modulus around 4 GPa, which makes them particularly suitable as base material to fabricate Atomic Force Microscopy (AFM) probes for non-destructive analysis of fragile samples such as biological materials. In this work, it is shown how by introducing an appropriate processing step consisting of a hard bake, the built-in stress gradient of the final structure was considerably reduced. This improved probes properties such as initial bending and aging and proved the epoxy based resists as good candidates for the low-cost fabrication of micromechanical systems (MEMS) and devices in general.

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Type
research article
DOI
10.1016/j.mee.2008.12.033
Web of Science ID

WOS:000267273300203

Author(s)
Martin, Cristina
Llobera, A.
Villanueva, Guillermo  
Voigt, A.
Gruetzner, G.
Brugger, Juergen  
Perez-Murano, Francesc
Date Issued

2009

Publisher

Elsevier

Published in
Microelectronic Engineering
Volume

86

Issue

4-6

Start page

1226

End page

1229

Subjects

AFM probes

•

SU-8

•

Photoplastic

•

Stress gradient reduction

•

Polymeric mechanical systems

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
LMIS1  
NEMS  
Available on Infoscience
May 16, 2009
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/40114
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