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conference paper

Reliability in the Dark Silicon Era

Falsafi, Babak  
2011
2011 IEEE 17th International On-Line Testing Symposium (IOLTS)
17th IEEE International On-Line Testing Symposium (IOLTS)

Information technology is now an indispensable pillar of a modern-day society, thanks to the proliferation of digital platforms in the past several decades. The demand on robust and economical data processing and storage, however, is growing faster than technology can sustain. Moreover, while forecasts indicate that chip density scaling will continue for another decade, the diminishing returns in supply voltage scaling preclude activating all on-chip transistors simultaneously, leading designs towards energy-centric solutions on "dark silicon". In this talk, I will describe this paradigm shift towards energy-centric server designs and its implications on fault tolerance and reliability.

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Type
conference paper
Web of Science ID

WOS:000299092600001

Author(s)
Falsafi, Babak  
Date Issued

2011

Publisher

IEEE Computer Soc Press, Customer Service Center, Po Box 3014, 10662 Los Vaqueros Circle, Los Alamitos, CA 90720

Published in
2011 IEEE 17th International On-Line Testing Symposium (IOLTS)
Series title/Series vol.

IEEE International On-Line Testing Symposium

Start page

V

End page

V

Editorial or Peer reviewed

NON-REVIEWED

Written at

EPFL

EPFL units
PARSA  
Event nameEvent placeEvent date
17th IEEE International On-Line Testing Symposium (IOLTS)

Athens, Greece

Jul 13-15, 2011

Available on Infoscience
June 25, 2012
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/82188
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