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conference paper

Optical characterization of subwavelength-scale solid immersion lenses

Kim, Myun-Sik  
•
Scharf, Toralf  
•
Haq, Mohammad Tahdiul
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2012
Proceedings of SPIE
SPIE Photonics West

We present the fabrication and optical characterization of nano-scale solid immersion lenses (nano-SILs) with sizes down to a subwavelength range. Submicron-scale cylinders fabricated by electron-beam lithography (EBL) are thermally reflowed to form a spherical shape. Subsequent soft lithography leads to nano-SILs on transparent substrates, i.e. glass, for optical characterization with visible light. The optical characterization is performed using a high-resolution interference microscope (HRIM) with illumination at 642 nm wavelength. The measurements of the 3D amplitude and phase fields provide information on the spot size and the peak intensity. In particular, the phase measurement is a more convincing proof of the Airy disc size reduction rather than the full-width at half maximum (FWHM) spot size. The focal spots produced by the nano-SILs show both spot-size reduction and enhanced optical intensity, which are consistent with the immersion effect. In this way, we experimentally confirm the immersion effect of a subwavelength-size SIL (d = 530 nm and h = 45 nm) with a spot reduction ratio of 1.35, which is less than the expected value of 1.5, most likely due to the slightly non-ideal shape of the nano-SIL.

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Type
conference paper
DOI
10.1117/12.905472
Web of Science ID

WOS:000302640700032

Author(s)
Kim, Myun-Sik  
Scharf, Toralf  
Haq, Mohammad Tahdiul
Nakagawa, Wataru
Herzig, Hans Peter  
Date Issued

2012

Publisher

Spie-Int Soc Optical Engineering, Po Box 10, Bellingham, Wa 98227-0010 Usa

Published in
Proceedings of SPIE
Series title/Series vol.

Proceedings of SPIE

Volume

8249

Issue

82491B

Subjects

electron-beam lithography

•

thermal reflow

•

soft lithography

•

solid immersion lens (SIL)

•

nano-SIL

•

subwavelength-size SIL

•

spot size reduction

•

3D amplitude and phase measurement

Editorial or Peer reviewed

NON-REVIEWED

Written at

EPFL

EPFL units
OPT  
Event nameEvent placeEvent date
SPIE Photonics West

San Francisco, California, USA

January 21-26, 2012

Available on Infoscience
March 15, 2012
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/78763
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