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conference paper

Pico-Watt Source-Coupled Logic Circuits

Tajalli, Armin  
•
Leblebici, Yusuf  
•
Brauer, Elizabeth J.
2008
16th IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC)
16th IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC)

This article explores the main tradeoffs in design of subthreshold source-couple logic (STSCL) circuits. It is shown analytically that the bias current of each STSCL gate can be reduced to few pico-amperes with a reliable logic operation. Measurements on different digital building blocks are provided to validate the main concepts presented in this paper. Implemented in conventional 0.18um CMOS technology, the bias current of each STSCL gate can be reduced below 10pA, which corresponds to a power-delay product (PDP) of less than 500aJ.

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Type
conference paper
Author(s)
Tajalli, Armin  
•
Leblebici, Yusuf  
•
Brauer, Elizabeth J.
Date Issued

2008

Publisher place

Greece

Published in
16th IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC)
Subjects

Source-coupled logic (SCL)

•

Current-mode logic (CML)

•

MOS current-mode logic (MCML)

•

Ultra low power

•

Weak inversion MOS

•

Subthreshold MOS

URL

URL

http://vlsi.ee.duth.gr/vlsisoc-2008/program/program.htm
Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
LSM  
Event nameEvent placeEvent date
16th IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC)

Rhodes Island, Greece

October 13-15

Available on Infoscience
August 5, 2008
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/27239
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