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  4. Oxygen DX center in In0.17Al0.83N: Nonradiative recombination and persistent photoconductivity
 
research article

Oxygen DX center in In0.17Al0.83N: Nonradiative recombination and persistent photoconductivity

Meli, Rocco
•
Miceli, Giacomo  
•
Pasquarello, Alfredo  
February 13, 2017
Applied Physics Letters

Using a hybrid density-functional scheme, we address the O impurity substitutional to N (O-N) in In0.17Al0.83N. Our modelling supports In clustering to account for the strong band-gap bowing observed in InxAl1-xN alloys. To study the ON defect in In0.17Al0.83N alloys, we therefore consider a model containing an In cluster and find that the most stable configuration shows four In nearest neighbors. We show that such a ON defect forms a DX center and gives rise to two defect levels at 0.70 and 0.41 eV below the conduction band edge, in good agreement with experiment. The calculated defect energetics entail a fast nonradiative recombination upon photoexcitation at room temperature and account for the observation of persistent photoconductivity at low temperature. Published by AIP Publishing.

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Type
research article
DOI
10.1063/1.4975934
Web of Science ID

WOS:000394761700019

Author(s)
Meli, Rocco
Miceli, Giacomo  
Pasquarello, Alfredo  
Date Issued

2017-02-13

Publisher

American Institute of Physics

Published in
Applied Physics Letters
Volume

110

Issue

7

Article Number

072101

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
CSEA  
Available on Infoscience
September 30, 2024
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/136940.3
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