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research article

Characterization of atomic force microscope probes at low temperatures

Radenovic, A.  
•
Bystrenova, E.  
•
Libioulle, L.
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2003
Journal of Applied Physics
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Type
research article
DOI
10.1063/1.1604952
Web of Science ID

WOS:000185419600080

Author(s)
Radenovic, A.  
Bystrenova, E.  
Libioulle, L.
Valle, F.
Shubeita, G. T.
Kasas, S.  
Dietler, G.  
Date Issued

2003

Publisher

American Institute of Physics

Published in
Journal of Applied Physics
Volume

94

Issue

6

Start page

4210

End page

4214

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
LPMV  
LBEN  
Available on Infoscience
June 20, 2007
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/9084
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